Capabilities
Quality Inspection & Metrology
Quality inspection planning for dimensional checks, surface review, leak testing, material documentation, and project-specific quality records.
Quality Inspection & Metrology
Quality documentation should match the drawing, application, and agreed inspection scope. For custom parts, the inspection plan can cover dimensional checks, surface review, material documentation, and functional tests when specified.
Dimensional Inspection
Coordinate Measuring Machine (CMM)
| Capability | Review Scope |
|---|---|
| Dimensional checks | Based on customer drawing and critical features |
| Repeatability | Confirmed by inspection method and part geometry |
| Measuring range | Confirmed by part size and fixture requirements |
| Touch or non-contact method | Selected by material risk and geometry |
| Surface form review | Available when required by specification |
| Report format | Confirm before quotation |
Dimensional inspection and report scope are agreed before production. Critical features can be traced to the customer drawing when an inspection report is part of the order requirement.
Optical & Laser Measurement
For large, thin, or delicate parts where CMM contact could cause breakage:
| Instrument | Parameter | Resolution |
|---|---|---|
| Laser micrometer | OD, wall thickness | Method-dependent |
| Optical comparator | Profile, angles, radii | Method-dependent |
| Digital height gauge | Step heights, parallelism | Method-dependent |
Surface Metrology
White-Light Interferometer
| Parameter | Specification |
|---|---|
| Vertical resolution | Method-dependent |
| Lateral resolution | Method-dependent |
| Measurement area | Confirm by part size and inspection requirement |
| Stitching | Confirm by part size and inspection requirement |
| Output | Defined by agreed inspection scope |
Used for: Optical surface verification, polished surfaces, and weld seam flatness when specified.
Contact Profilometer
| Parameter | Specification |
|---|---|
| Vertical resolution | Method-dependent |
| Stylus force | Selected by material and surface risk |
| Scan length | Confirm by part geometry |
| Output | Defined by agreed inspection scope |
Used for: Production Ra verification on ground and lapped surfaces; compliance with drawing Ra call-outs.
Atomic Force Microscope (AFM)
| Parameter | Specification |
|---|---|
| Vertical resolution | Method-dependent |
| Scan area | Confirm by inspection requirement |
| Mode | Selected by surface and material |
| Output | Defined by agreed inspection scope |
Used for: Optical polishing verification, subsurface damage studies, or bonding surface qualification when specified.
Leak Testing
Helium Mass Spectrometer Leak Tester
| Parameter | Specification |
|---|---|
| Sensitivity | Confirm by test provider and method |
| Pass criterion | Defined by customer specification |
| High-integrity criterion | Reviewed case by case |
| Method | Confirmed by component geometry |
| Applicable components | Welded vessels, closed cavities, vacuum-rated assemblies |
Leak testing can be arranged for relevant fusion-welded quartz assemblies when the order specifies a test method and acceptance criterion.
Material Purity Verification
ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometry)
| Parameter | Specification |
|---|---|
| Analytes | Na, K, Li, Ca, Mg, Fe, Cr, Ni, Cu, Al, B, and 20+ trace metals |
| Detection limit | Lab- and element-dependent |
| Sample preparation | Confirm by lab method |
| Turnaround | Confirm by lab and order scope |
Material certificates or trace-metal analysis can be discussed based on material source, order scope, and customer quality requirements.
Crystal & Optical Characterization
X-Ray Diffraction (XRD) — Crystal Orientation
| Parameter | Specification |
|---|---|
| Crystal orientation accuracy | Defined by customer specification and method |
| Applicable materials | Sapphire, single-crystal materials |
| Method | Confirm before quotation |
| Report | Available when included in the agreed inspection scope |
Crystal orientation verification can be arranged for sapphire components when the drawing or order requires it.
Polariscope — Birefringence Measurement
| Parameter | Specification |
|---|---|
| Sensitivity | Method-dependent |
| Measurement range | Method-dependent |
| Applicable materials | Transparent quartz and fused silica |
| Standard criterion | Defined by customer specification |
UV-VIS-NIR Transmission Measurement
Optical transmission verification can be discussed for optical-grade windows, viewports, and laser optics when wavelength and report requirements are specified.
Quality Management System
Quality management and documentation requirements should be confirmed for the quotation or project file:
| Element | Details |
|---|---|
| QMS documents | Latest available documents can be requested for supplier review |
| Calibration | Instrument and method traceability confirmed when required |
| Non-conformance | Non-conformance handling can be discussed for project requirements |
| First Article Inspection | FAI report can be discussed for new part numbers |
| Lot traceability | Traceability scope depends on material source and order documentation |
Documents that can be discussed before order placement:
- Material certificate, depending on material source and order scope
- Dimensional inspection report for agreed critical features
- Surface roughness report when a surface requirement is specified
- Certificate of conformance or project-specific quality documents when applicable
Optional documents (request at order placement):
- Birefringence test report
- He leak test certificate
- XRD crystal orientation report
- ICP-OES trace metal analysis
- Optical transmission test report